Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for X-ray Computed Tomography Microscope
Summary
The National Institute of Standards and Technology (NIST) is seeking sources for a new X‑ray Computed Tomography (XCT) microscope to replace its aging Zeiss Versa XRM 500 system. The instrument will provide micro‑scale three‑dimensional imaging of semiconductor materials with sub‑450 nm spatial resolution and advanced software reconstruction capabilities, supporting NIST’s material characterization mission.